Farnell is now shipping more than 100 types of reed relays from Pickering Electronics


Pickering Electronics’ range of innovative, high reliability reed relays for demanding instrumentation, test and measurement and semiconductor test applications are now in stock and available for fast delivery from Farnell.

Farnell, an Avnet company and global distributor of electronic components, products and solutions, has enhanced its comprehensive electromechanical portfolio with the addition of Pickering Electronics. Specialising in the manufacture of high-quality, high reliability reed relays, Pickering Electronics has been market leaders for more than 50 years. Farnell is now offering fast delivery on more than 100 types of reed relays from Pickering Electronics, which are suitable for semiconductor test, ATE systems, test and measurement equipment, instrumentation, electric vehicle test and renewable energy applications.

Pickering Electronics’ innovative high performance reed relays are designed to a high standard and rigorously tested to ensure long life and optimum performance. The company’s relays feature instrumentation grade reed switches, which are 100% tested for all operating parameters, and are 100% thermal cycle tested from -20°C to +85°C to -20°C. This process is repeated three times to stress test the manufacturing processes. All switch contacts are hermetically sealed preventing contact oxidization, which can occur in conventional open format relays. These procedures result in delivery of a relay with a stable long life up to 5x10E9 operations.

Pickering Electronics manufacture the smallest high voltage reed relays available on the market. For example, the Series 131 has a minimum 1.5kV stand-off, as well as the world’s smallest reed relay footprint – the Series 120 which offers up to 1 Amp at 20 Watts on a 4mm x 4mm pitch. These ultracompact devices enable designers to fit up to 85% more relays on a printed circuit board (PCB) compared to common industry standard-sized relays, providing more switching options when designing demanding test systems.

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